SEM microscope Phenom ParticleX TC

for analysismultipurposedesktop

Component cleanliness analysis with a multi-purpose desktop SEM. Desktop SEM for component cleanliness analysis The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling technical cleanliness at the microscale. Materials characterization A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is simple to operate and fast to learn, opening up particle and material analysis to a wider group of users. Key Features Technical cleanliness With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy with energy-dispersive X-ray spectroscopy (EDS). This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407 are available. Secondary electron detector A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore the perfect choice to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important.