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Field emission scanning electron microscope Phenom Pharos G2
educationalindustrialfor quality control

field emission scanning electron microscope
field emission scanning electron microscope
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Characteristics

Type
field emission scanning electron
Technical applications
educational, industrial, for quality control, for materials research
Configuration
tabletop
Detector type
secondary electron, back-scattered electron
Magnification

2,000,000 unit

Resolution

2 nm, 3 nm, 10 nm

Description

Tabletop field emission gun scanning electron microscope for high quality imaging across disciplines. Field emission gun scanning electron microscope The Thermo Scientific Phenom Pharos G2 FEG-SEM brings field emission SEM to your tabletop. The Phenom Pharos G2 FEG-SEM will outperform many floor-standing SEMs in terms of image quality, while offering a vastly better user experience. For academic and industrial laboratories that so far did not consider SEM a realistic option, the Phenom Pharos G2 FEG-SEM makes FEG performance accessible thanks to its attractive form factor and short training required. Blazing fast sample loading means fast sample exchange, which means higher productivity. Unlike other SEMs, which end up being fully booked, the Phenom Pharos G2 FEG-SEM performs imaging and analysis jobs so quickly that it serves well as a walk-up tool. The new Phenom Pharos G2 FEG-SEM expands its acceleration voltage range down to 1 kV, to better accommodate insulating and beam-sensitive samples, and up to 20 kV, with a resolution of 2.0 nm that reveals the finest details. Unique field emission source Unique among desktop SEMs, the Phenom Pharos G2 FEG-SEM offers a field emission source, which guarantees high brightness, crisp images, and stable beam current. Excellent resolving power The Phenom Pharos G2 FEG-SEM offers a resolution of 2.0 nm at 20 kV. Such performance shows the shape of nanoparticles, imperfections in coatings, or other features that would be missed by tungsten SEMs or other tabletop SEMs.

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