Scanning electron microscopy characterization of nanomaterials with sub-nanometer resolution and high material contrast.
Verios 5 XHR Scanning Electron Microscope
The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.
Scanning electron microscopy characterization
• High resolution nanomaterial imaging with the UC+ monochromated electron source for sub-nanometer performance from 1-30 kV.
• High contrast on sensitive materials with excellent performance down to 20 eV landing energy and high-sensitivity in-column and below-the-lens detectors and signal filtering for low-dose operation and optimal contrast selection.
• Greatly reduced time to nanoscale information for users with any experience level using the Elstar electron column featuring SmartAlign and FLASH technologies.
• Consistent measurement results with ConstantPower lenses, electrostatic scanning and a choice of two piezoelectric stages.
• Flexibility for accessories with a large chamber.
• Unattended SEM operation with Thermo Scientific AutoScript 4 Software, an optional Python-based application programming interface.
SmartAlign technology
SmartAlign technology eliminates the need for any user alignments of the electron column, which not only minimizes maintenance, but also increases your productivity.