Focused ion beam system

Broad ion beam milling for surface and cross-section polishing of samples for SEM imaging and characterization High-quality observation and characterization of materials often require an artifact-free surface, which can be difficult to achieve with traditional polishing techniques like grinding or mechanical polishing. The Thermo Scientific CleanMill Broad Ion Beam System is the complete ion beam polishing solution for SEM applications in materials science, enabling optimal imaging and analysis of materials where a pristine surface is required, including beam- and air-sensitive materials. The CleanMill System is fully compatible with the Thermo Scientific CleanConnect Sample Transfer System, making it easy to quickly transfer samples between instruments while minimizing sample handling. High-energy ion source The ultra-high-energy ion source features a maximum accelerating voltage of 16 kV to rapidly mill and polish sample surfaces. Ultra-fine surface polishing The CleanMill System can be configured with an optional low-energy ion gun for final polishing of sample surfaces. Wide acceleration voltage The system delivers ion energy ranging from 2 kV to 16 kV and features dedicated optics for ultra-low-voltage polishing from 100 V to 2 kV. CleanConnect System compatibility Safely transfer samples from the CleanMill System to the microscope chamber using the Thermo Scientific IGST (inert gas sample transfer) Workflow to observe materials in their native states. Real-time monitoring The integrated touchscreen and high-resolution camera help you keep track of the broad ion beam milling process.