Optical microscope 1100TN

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The Trek Model 1100TN Electrostatic Force Microscope (EFM) enables voltage distribution measurements with a very high spatial resolution better than 10μm which is well beyond the capability of typical electrostatic voltmeters. Trek’s EFM can also measure voltage distribution across a much larger surface area as compared to a scanning probe microscope when operated under atmospheric conditions. Trek’s EFM employs a feedback voltage to the detector which is equal to the measured voltage thus preventing arcing between the detector and the surface under test. Key Specifications Voltage Range: ±1 kV Voltage Sensitivity: Accuracy: Better than 0.5% of full scale Better than 100 mV Incremental Step: 1 µm, minimum (detector) Detector Tip: 5 µm X 5 µm Measurement Area: 5 mm X 5 mm Typical Applications Include Measurement of antistatic bags, Si wafer Electrophotography material testing Photovoltaic materials evaluation MEMS testing Features and Benefits Can be used in atmosphere conditions Spatial resolution is better than 10 μm Three measurement modes: - Static - Line Profile - 3D Mapping