Defect inspection machine

opticalfor the electronics industryhigh-speed

The front-end process is a key element of the display panel manufacturing process. AOI inspection technology is used in the array panel manufacturing process to monitor appearance defects; the détection précision and efficiency play a vital rôle on product yield and cost. The détection of peripheral circuits and irregular régions is a major quality control problem faced by the array sections in display factories. TZTEK's AOI equipment for array Processing adopts TZTEK's independently developed Virgo software platform and a unique platform calibration technology. It is suitable for defect détection in array substrates throughout the manufacturing process, and features fast scanning speed and high imaging accuracy (détection précision of 1.0 pm/1.5 pm available). Program Advantage 1. - TZTEK’s unique calibration platform technology supports better image stitching and realizes régional détection. Periodic comparison is adopted for the AA zones, while panel-to-panel comparison is adopted for the peripheral zones 2. - TZTEK's independently developed Virgo software platform supports the création of rectangular, circular, semicircular, and other irregular maps 3. - Détection précision of 1.0 pm /1.5 pm available