- Metrology - Laboratory
- Metrology and Test Equipment
- Critical dimension measuring system
- TZTEK Technology Co.,ltd
Critical dimension measuring system MT3000VIS/IRinfraredcamera-basedfor semiconductors
Add to favorites
Compare this product
Characteristics
- Measured physical value
- critical dimension
- Technology
- camera-based, infrared
- Measured material
- for semiconductors
Description
TZTEK’s infrared system in a leading position globally. The system combines high performance infrared camera with design-optimized infrared optics for generating images with excellent resolution and contrast.Effective measurement of features on the top, bottom and inside of substrate.
main features
•Available for customized handling solutions
•Combination of visible and infrared illumination in reflected and transmitted modes
•SECS/GEM
•Low maintenance cost, stable and reliable
Related Searches
- TZZEK Tochnology measuring system
- TZZEK Tochnology optical measuring system
- Automatic measuring machine
- TZZEK Tochnology high-precision measuring system
- TZZEK Tochnology measuring system for industrial applications
- Parts measuring machine
- Distance measuring machine
- TZZEK Tochnology non-contact measuring system
- TZZEK Tochnology video measuring system
- TZZEK Tochnology diameter measuring system
- Thickness measurement system
- CNC measuring machine
- High-speed measuring machine
- TZZEK Tochnology contour measuring system
- Angle measuring machine
- TZZEK Tochnology shape measuring system
- High-resolution measuring machine
- Roundness measuring machine
- Wafer measurement system
- TZZEK Tochnology concentricity measuring system
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.