Seebeck Coefficient / Electric Resistance Measurement System ZEM-5 series
A series corresponding to special specifications for the properties of various thermoelectric materials and thin films
Seebeck Coefficient/Electric Resistance Measurement Systems that can meet various needs with specifications specialized to the characteristics of materials including high-temperature materials, high-resistance materials, and thin films.
SPECIAL FEATURES / FURTHER APPLICATIONS
APPLICATIONS
Evaluate the thermoelectric properties of a wide variety of materials including semiconductors, ceramics, and metals
FEATURES
A series corresponding to special specifications for the characteristics of various thermoelectric materials and thin films
A type C thermocouple is used for the temperature detection sensor, making this system optimal for evaluating Si-based thermoelectric materials (SiGe, MgSi, others) (model HT)
V/I plot that self-diagnoses the ohmic contact is standard
Measurement of high temperature up to 1200°C (model HT)
Measurement of high resistance of maximum 10 MΩ (model HR)
Measurement of materials formed as a film on substrates (model TF)
Measurement of low temperature from -150°C to 200°C (model LT)
A patent and a standard
Thermoelectric power JIS R 1650-1
Resistivity JIS R 1650-2