Refractive index detector PVI-3TE-4
semiconductordynamichemispherical

Refractive index detector - PVI-3TE-4 - Vigo Photonics - semiconductor / dynamic / hemispherical
Refractive index detector - PVI-3TE-4 - Vigo Photonics - semiconductor / dynamic / hemispherical
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Characteristics

Detected entity
refractive index
Technology
semiconductor, dynamic, hemispherical, IR
Other characteristics
compact, rugged, wavelength, thermoelectrically-cooled

Description

PVI-3TE-4-1x1-TO8-wAl2O3-36 and PVI-3TE-4-1x1-TO66-wAl2O3-36 are three-stage thermoelectrically cooled (3TE) photovoltaic IR detectors based on HgCdTe heterostructures for optimal performance and stability, optically immersed to enhance the parameters. Their specific wavelength (λspec) is 4.0 µm and their optical area (Ao) is 1 mm × 1 mm. The cut‑on wavelength (λcut-on) can be optimized upon request. Applying a reverse bias (Vb) may significantly increase response speed and dynamic range. While this improves performance at high frequencies, be aware that the 1/f noise appearing in biased detectors may reduce performance at low frequencies. The detectors are available in TO8 and TO66 packages with a 3 deg. wedged sapphire window (wAl2O3) to prevent unwanted interference effects. Features - Spectral range: 2.3 to 4.4 µm - Back-side illuminated - Three-stage thermoelectrically cooled - Unique immersion lens technology applied - No bias required - No 1/f noise - No minimum order quantity required Applications - Gas detection, monitoring and analysis: CH4, C2H2, CH2O, HCl, NH3, SO2, C2H6, CO2 - Breath analysis: C2H6, CH2O, NH3 - Explosion prevention - Exhaust gas denitrification - Emission control (exhaust fumes, greenhouse gases) - Contactless temperature measurements (metal industry)

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