Refractive index detector PCI-4TE-12

opticalsemiconductordynamic

1.0 – 13.3 µm, three-stage thermoelectrically cooled PC-4TE-12 is four-stage thermoelectrically cooled IR photoconductive detector based on sophisticated HgCdTe heterostructure for the best performance and stability. The device is optimized for the maximum performance at λopt = 12.0 μm. The device should operate in optimum bias voltage and current readout mode. Performance at low frequencies is reduced due to 1/f noise. 3° wedged zinc selenide anti-reflection coated (wZnSeAR) window prevents unwanted interference effects. Features: - High performance in the 1.0 - 13.3 µm spectral range - Four-stage thermoelectrically cooled - Hyperhemiimmersion microlens technology applied - Active area from 50×50 µm^2 to 2×2 mm^2 - Long lifetime and MTBF - Stability and reliability - 1/f noise Parameter: PCI-4TE-12 Material: MCT Type: Photoconductive Immersion: Immersion Cooling: Four-stage Wavelength/ λopt/ µm: 12 Package: TO8, TO66 Window: wedged ZnSe AR coated Detectivity/ D∗/ cm⋅Hz1/2⋅W−1: ≥2,0x109 Time constant/ τ/ ns: ≤7