EDXRF spectrometer Genius IF

for the metallurgical industrycost-effectivebenchtop

Bench Top EDXRF Spectrometer With Secondary Targets Xenemetrix’s Genius IF (Secondary Targets) EDXRF spectrometer offers a cost-effective solution in today’s market of elemental analysis. The analyzer provides a non-destructive qualitative and quantitative determination from Carbon(6) to Fermium(100), providing detection limits from sub-ppm to high weight percent concentrations. The Genius IF has powerful components including: A fully integrated computer system A high resolution Slicon Drift Detector A powerful X-Ray tube with variable spot sizes, designed to accommodate samples of various sizes Eight secondary targets and eight customizable tube filters for fast and accurate determination of trace and minor elements Genius IF can also operate in the classical direct excitation mode. Silicon Drift Detector(SDD): the Silicon Drift Detector enables high count rates, improved resolution, down to 125eV and fast response time, in order to minimize operational down time. SDD LE- Ultra – Ultra-thin detector window provides superior performance for low Z elements analysis. Secondary Targets: The Genius IF has a unique patented geometry combining eight secondary targets, with eight customizable tube filters used in direct excitation mode, to allow optimal excitation of all elements that can be detected in EDXRF. The WAG (Wide Angle Geometry) patented secondary target technique provides the best results for major, minor and trace element analysis.