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EDXRF spectrometer X-Cite
for the metallurgical industrycompactbenchtop

EDXRF spectrometer
EDXRF spectrometer
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Characteristics

Type
EDXRF
Domain
for the metallurgical industry
Configuration
compact, benchtop
Detector type
with SiLi detector
Other characteristics
robust

Description

System Specifications: Non-destructive elemental analysis C(6)-Fm(100) from PPM to 100% concentrations. Six customizable filters for fast and accurate determination of trace and minor elements. Down to 125eV resolution. Robust design, compact geometry. Sample tray with 8/16 positions. Easy to operate thanks to the proprietary nEXt™ software package. Xenemetrix’s X-Cite Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the most convenient price/performance solution in the market for elemental analysis. The compact spectrometer fits conveniently on a traditional laboratory bench and includes a completely integrated computer system. The robust design and build make the instrument ideal for a mobile laboratory. Xenemetrix’s X-Cite uses a high resolution detector and a powerful X-Ray tube with variable spot sizes to accommodate samples of various sizes. The analyzer provides non-destructive qualitative and quantitative determination of C(6)-Fm(100). The end result is exceptional product, able to deliver powerful analytical results today and into the future. This approach is particularly valuable in applications where limited sample quantities are available or where sample integrity must be preserved for other purposes. The innovative unit outperforms traditional systems without the cost and difficulties associated with liquid nitrogen cooling. Full computing capabilities are integrated into the system’s design for comprehensive data analysis and transfer.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.