The DX-2012M silicon steel material measuring device is suitable for measuring various hot rolled, cold rolled oriented and non-oriented silicon steel materials, as well as the measured silicon steel transformer core. It can accurately measure the magnetic induction Bm, specific loss Ps, hysteresis loop and AC magnetization curve of silicon steel materials under power frequency conditions.
Windows measurement software is applied simply. The product conforms to China National Standards GB/T 3655-2000, GB/T 13789-92 and international standards IEC 404-2, IEC 60404-3, and IEC 60404-6.
The controlling of computer and A/D sampling replace the traditional analog bridge, frequency meter, ammeter, voltage meter, and power meter, the whole testing process is automatically completed.
- Testing sample varieties: hot rolling, cold rolling silicon steel materials, permalloy, amorphous and nm crystal.
- Testing sample shapes: ribbon and chip open samples, annular, E and U closing samples.
- Open circuit samples adopt EpsteinSquare to form a closed magnetic circuit, and can also select permeameter. The closing sample can be put under direct winding measurement, finished transformer can be also put under direct measurement.
- Sample( iron core), magnetizing coil (N1) and measuring coil (N2) form a no-load transformer.
- Non-inductive resistance is connected to magnetizing coil loop to determine magnetizing current and magnetic field intensity through the measurement of pressure drop on noninductive resistance, magnetic field peak value can be locked through digital feedback, and magnetic field lock precision 0.5%.