Hall effect measurement system DX-1000L

concentricityresistivityfor semiconductors

DX-1000L Low Temperature Hall Effect Test System consists of an electromagnet, electromagnet power supply, high-precision constant current source and high-precision voltmeter, Hall effect sample holder, standard sample, high and low temperature Dewar, temperature controller, and system software. DX-1000L Low Temperature Hall Effect Test System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices. and electrical properties of semiconductor materials. The experimental results are automatically calculated by the software, and parameters such as Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, and Magnetoresistance can be obtained at the same time.