The magneto-optical Kerr effect is used to measure the hysteresis loop of magnetic materials, and the in-plane hysteresis loop and vertical hysteresis loop can be measured simultaneously.
High-precision characterization of the magnetism of ferromagnetism, artificial antiferromagnetism, two-dimensional materials, and microelectronic devices using the magneto-optic Kerr effect. The in-plane and vertical magnetic fields can be applied at the same time, and the in-plane magnetization component and the vertical magnetization component can be scanned simultaneously, that is, the hysteresis loop of any combination of the in-plane magnetic field/vertical magnetic field-in-plane component/perpendicular component can be obtained at the same time. The detection accuracy of Kerr rotation angle is as high as 0.3 mdeg (RMS), and it can detect the magnetization of single atomic layer. A wire-tie sample holder is provided for the characterization of electrical-magneto-optical properties.
The product is independently developed by the company, with strong stability and good scalability, and provides customized services; compared with similar equipment in the same industry, it has a larger magnetic field and higher precision, and can achieve in-plane and vertical hysteresis loop measurements without changing the optical path. Laser automatic alignment, highly intelligent software support.
As an ideal tool for high-speed, high-precision, non-destructive measurement of material magnetism, this product can provide more choices and assistance for high-end scientific research and enterprise production and development.