Field emission scanning electron microscope ZEISS Crossbeam

for materialshigh-resolutionmodular

Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications. Maximize your SEM insights Increase your FIB sample throughput Experience best 3D resolution in your FIB-SEM analysis Maximize Your SEM Insights Extract true sample information from your high resolution SEM images using Gemini electron optics.​ Count on the SEM performance of your Crossbeam for 2D surface sensitive images or when performing 3D tomography​. Benefit from high resolution, contrast and signal-to-noise ratios, even when using very low accelerating voltages​. Characterize your sample comprehensively with a range of detectors. Get pure materials contrast with the unique Inlens EsB detector​. Investigate non-conductive specimens undisturbed by charging artifacts. Increase Your FIB Sample Throughput​ Profit from speed and precision of intelligent FIB scanning strategies for material removal and perform your experiments up to 40% faster than before.​ The Ion-sculptor FIB column introduces a new way of FIB-processing: by minimizing sample damage you’ll maximize sample quality and perform experiments faster at the same time. ​