Field emission scanning electron microscope ZEISS GeminiSEM

for researchindustrialhigh-contrast

ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility. Take sub-nanometer images below 1 kV without an immersion lens. Discover three unique designs of the ZEISS Gemini electron optics. Ideal for core facilities - ZEISS GeminiSEM 360 Enabling efficient analysis - ZEISS GeminiSEM 460 New standard for surface imaging – ZEISS GeminiSEM 560 Benefit from surface sensitive imaging and gather information at low voltage or at high probe current. Discover the advantages of Inlens detection, NanoVP, contextual image viewing or AI-powered segmentation.​ Switch seamlessly from low current-low kV work to high current-high kV work. Extend your possibilities with an in situ heating and tensile lab. Take advantage of a coplanar EDS/EBSD configuration, shadow-free mappings of EDS data and rapidly collecting EBSD maps with 4000 patterns/s. Explore the new standard for surface imaging: magnetic field-free imaging with sub 1 nm resolution below 1kV without sample biasing or monochromation, Gemini 3 with its new electron optical engine Smart Autopilot, finding the sweet spot in your working conditions – and much more.