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X-ray microscope ZEISS Xradia Ultra
laboratory3Dhigh-resolution

X-ray microscope - ZEISS Xradia Ultra  - ZEISS Métrologie et Microscopie Industrielle - laboratory / 3D / high-resolution
X-ray microscope - ZEISS Xradia Ultra  - ZEISS Métrologie et Microscopie Industrielle - laboratory / 3D / high-resolution
X-ray microscope - ZEISS Xradia Ultra  - ZEISS Métrologie et Microscopie Industrielle - laboratory / 3D / high-resolution - image - 2
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Characteristics

Type
X-ray
Technical applications
laboratory
Observation technique
3D
Other characteristics
high-resolution

Description

Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications. Non-destructive imaging in native environment​ Nanoscale 3D X-ray imaging at a spatial resolution down to 50 nm and 16 nm voxel sizes 3D and 4D in situ experiments Quantification of nanostructures and using the data for modelling input Exploring hard and soft materials Supercharge Your Research with Non-destructive Nanoscale Imaging​ Harness unique non-destructive imaging to observe nanoscale phenomena in their native environments in 3D. ​ Benefit from the only instrument that fills the gap between sub-micron resolution XRMs (such as ZEISS Xradia Versa) and higher resolution, but destructive 3D imaging e.g., FIB-SEMs.​ Use integrated in situ solutions to perform leading non-destructive 3D / 4D X-ray imaging in your laboratory, with a resolution down to 50 nm and a voxel size of 16 nm. ​ Accelerate your research by adding these unique capabilities to your analytical portfolio. Achieve Superior Contrast and Image Quality Observe defects in 3D without destroying your sample or altering the data with slicing artifacts. ​
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