X-ray microscope ZEISS XRADIA Context microCT

for analysisfor electronic components3D

ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times. Obtain 3D data on entire intact electronic components, large materials samples, or biological specimens. Perform non-destructive failure analysis to identify internal defects without cutting your sample or workpiece. Characterize and quantify performance-defining heterogeneities in your geo samples, like porosity, cracks, inclusions, defects, or multiple phases. Perform 4D evolutionary studies, through ex situ treatment or in situ sample manipulation. Connect to the ZEISS correlative microscopy environment and perform nondestructive 3D imaging to identify regions of interest for subsequent analysis. Full Context 3D Imaging Xradia Context provides you with superb image quality, stability, and usability, along with an efficient workflow environment and high throughput scanning Resolve fine details in their full 3D context, even within a relatively large imaging volume, with a high pixel density detector of six megapixels Visualize buried structures non-destructively in 3D for process analysis, construction analysis and failure analysis Maximize geometric magnification with small samples to identify and characterize micron-scale structures with high contrast and clarity