X-ray computed tomography system ZEISS METROTOM 1500

CT3Dhigh-resolution

With ZEISS METROTOM 1500, you get advanced CT technology – reliably detecting flaws by capturing and measuring defects beneath the surface. What makes this CT different: It delivers fast and high-resolution images for both small and large parts – and everything in between. High-speed scanning Detailed CT image quality Accurate metrology (VDI/VDE 2630 1.3) Optional DAkkS certification Compact footprint Benefits Better image quality High resolution and traceable accuracy​ ​ ZEISS METROTOM 1500 features outstanding image quality that depicts even small defects clearly. The software AMMAR, BHC, and the hardware module ZEISS scatterControl make the difference for unchallenged quality. The CT is furthermore specified according to the VDI/VDE 2630 guideline for traceable accuracy.​ Thanks to ZEISS’ high level of metrology expertise, which is also used in CT technology, you can rely on high measurement accuracy. An MPE(SD) of 4.5 + L/50 μm according to VDI/VDE 2630 Sheet 1.3 is guaranteed over the entire field of view - for measurement results you can trust. Versatility of the system Suitable for a large variety of parts and applications​ ZEISS METROTOM 1500 scans small parts in very high resolution and parts of up to 615 mm in diameter and 800 mm in height as a complete reconstruction. This is achieved by expanding the field of view both horizontally and vertically.