{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
... Maximize your SEM insights Increase your FIB sample throughput Experience best 3D resolution in your FIB-SEM analysis Maximize Your SEM Insights Extract true ...
ZEISS Métrologie et Microscopie Industrielle
... inspection or biological or geological specimens. Make no compromises in high resolution imaging – go to low voltages and benefit from enhanced resolution and contrast at 1 kV or below. ...
ZEISS Métrologie et Microscopie Industrielle
Produce high quality images of large and heavy samples effortlessly with ZEISS Axiovert. Let the system take care of selecting the settings. Achieve consistently well illuminated and sharp images. Use ...
ZEISS Métrologie et Microscopie Industrielle
... on-axis zoom microscope Axio Zoom.V16 delivers both high resolution and a zoom range of 16x. Zoom seamlessly from overview to the smallest details - with a large free ...
ZEISS Métrologie et Microscopie Industrielle
... delivers breakthrough resolution performance, takes accessibility to the next level with an intuitive user experience, and accelerates productivity with faster throughput and time-to-results. 450 nm spatial resolution ...
ZEISS Métrologie et Microscopie Industrielle
... sub-micron resolution XRMs (such as ZEISS Xradia Versa) and higher resolution, but destructive 3D imaging e.g., FIB-SEMs. Use integrated in situ solutions to perform leading non-destructive 3D / ...
ZEISS Métrologie et Microscopie Industrielle
... easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The ...
ZEISS Métrologie et Microscopie Industrielle
Please specify:
Help us improve:
remaining