HAMAMATSU measuring systems

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optical measurement system
optical measurement system
C12562-04

... Optical NanoGauge Thickness measurement system C12562 is a compact, space-saving, non-contact film thickness measurement system designed to easily install in equipment ...

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HAMAMATSU
optical measurement system
optical measurement system
C10178-03E

The Optical NanoGauge Thickness measurement system C10178 is a non-contact film thickness measurement system utilizing spectral interferometry. Film thickness is measured ...

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HAMAMATSU
reflectance measurement system
reflectance measurement system
C11295

... NanoGauge Thickness measurement system C11295 is a film thickness measurement system utilizing spectral interferometry. It is designed to measure film thickness as part ...

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thickness measurement system
thickness measurement system
C10323-02

... Thickness measurement system C10323 is a microscopic thickness measurement systems. Objects with irregular surfaces that would produce high level of scattered light cannot be measured ...

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light measurement system
light measurement system
C14234-11

... important parameter, and researchers have been aware of the importance to control and to evaluate the molecular orientation of OLED devices. The C14234-11 is functional for measuring fluorescence spectrum ...

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light measuring system
light measuring system
C9920-12

... efficiency, measured usually by electroluminescence (EL) method. For this application the external quantum efficiency measurement system C9920-12 is designed. Integrating sphere : 3.3 inch inside diameter, ...

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