Hitachi analysis microscopes

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

... ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality elemental analysis. To allow for stable data acquisition at the instrument‘s highest performance levels, ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

... Experience with Advanced Automation The “EM Flow Creator“ software option allows users to configure repeatable SEM operation sequences. Various SEM functions can be assembled in the EM Flow Creator’s ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

... FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...

Resolution: 1.2 nm

... -based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. The SU5000 FE-SEM has forever ...

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize ...

Magnification: 6 unit - 800,000 unit
Resolution: 4, 5, 15 nm

... previously only available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance. The FlexSEM 1000 II Scanning Electron Microscope features ...

Magnification: 10 unit - 25,000,054 unit
Weight: 54 kg
Length: 614, 617 mm

... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...

Weight: 990 kg
Width: 1,190 mm
Height: 1,800 mm

The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond. The precision piezoelectric-driven actuator is equipped with X, Y and Z axes probe ...

The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components. Electron Beam Absorbed ...