Hitachi electron microscopes

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

... SU9000 utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the electron optics from environmental noise.

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

... newly designed electron optics and detection systems allows for efficient simultaneous acquisition of multiple secondary electron and back-scattered electron signals. Multi-Channel ...

Resolution: 1.2 nm

... -based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. The SU5000 FE-SEM has forever ...

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently ...

Magnification: 6 unit - 800,000 unit
Resolution: 4, 5, 15 nm

... available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance. The FlexSEM 1000 II Scanning Electron Microscope ...

Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.2, 0.14, 0.19 nm

... Innovation. Meeting and Exceeding Needs and Requirements in Many Fields. The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard ...

Weight: 990 kg
Width: 1,190 mm
Height: 1,800 mm

... manufacturing process of any nanoscale semiconductor devices. • The NP6800 Nano-Prober employs an optimized cold field-emission electron source, an eight-prober system, a temperature-controlled stage from -40 F to 302 ...

... layers. The EBAC technique is performed with the electron beam by passing through the dielectric layers down to the lower level metallization layer in order to absorb the electron beam current. The electron ...