Hitachi sample preparation systems

... TEM, etc. by extracting a micro sample with an ion beam in the vacuum chamber of an FIB system. FIB micro-sampling unit and FIB micro-sampling method An example of FIB micro-piller ...

... reduces average particle size • Optional chamber for samples up to 6 in (150 mm) in diameter • Optional spacer for samples up to 1.75 in (45 mm) tall • Main valve to keep the chamber under vacuum ...

... specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, ...

... specimens depending on the purpose. Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens. High Milling Rate The cross section milling rate*1 ...

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. The ArBlade 5000 is equipped with a fast-milling Ar ion ...

... possible data from your TEM samples. Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM II desktop sample ...