Jeol high-resolution microscopes

1 company | 8 products
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electron microscope
electron microscope
JEM-3300

... of the facility. These improvements allow users to obtain high quality images by simple operations even for those who have never used an electron microscope before. Features High ...

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electron microscope
electron microscope
JEM-ARM300F2

A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with ...

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scanning electron microscope
scanning electron microscope
JSM-IT710HR

... easily take high-resolution images. The JSM-IT710HR makes users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance ...

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FIB/SEM microscope
FIB/SEM microscope
JIB-PS500i

... system enables any operator to smoothly prepare specimens for TEM. HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging Stop hesitating, stop missing the end-point in milling. High ...

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transmission electron microscope
transmission electron microscope
JEM-F200

Resolution: 0.23, 0.19, 0.14, 0.16 nm

JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, ...

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electron microscope
electron microscope
JEM-1400Flash

Magnification: 10 unit - 1,500,000 unit
Resolution: 0.14, 0.2 nm

... with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function. Features • High-sensitivity sCMOS camera, "Matataki ...

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scanning electron microscope
scanning electron microscope
miXcroscopy™

... the scanning electron microscope to observe the fine structures at higher magnification & higher resolution.The observation targets found with the optical microscope can be seamlessly ...

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FIB/SEM microscope
FIB/SEM microscope
JIB-4700F

Magnification: 20 unit - 1,000,000 unit
Resolution: 4, 1.6, 1.2 nm

... function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features. High resolution SEM ...

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