Jeol observation microscopes

1 company | 13 products
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electron microscope
electron microscope
JEM-3300

... easy to operate and get high-contrast and high-resolution images." CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, ...

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electron microscope
electron microscope
JEM-ARM300F2

A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive ...

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scanning electron microscope
scanning electron microscope
JSM-IT710HR

... users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance from a new detector. *HR=High Resolution

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scanning electron microscope
scanning electron microscope
JSM-IT210

... is a new generation SEM that is compact and can be operated unattended. Features Guide from specimen exchange to automatic observation "Specimen Exchange Navi" 1. Follow the Navi to set specimen 2. ...

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FIB/SEM microscope
FIB/SEM microscope
JIB-PS500i

... operator to smoothly prepare specimens for TEM. HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging Stop hesitating, stop missing the end-point in milling. High quality SEM images assist you. • Signal ...

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electron microscope
electron microscope
JEM-Z300FSC

... side-entry liquid nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-EM) that enables observation of bio-molecules at cryo-temperature. The automated ...

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transmission electron microscope
transmission electron microscope
JEM-ARM200F

Resolution: 0.08 nm - 0.23 nm

... is achieved by a new STEM imaging technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages. The microscope room is separated from the operation ...

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transmission electron microscope
transmission electron microscope
JEM-2100Plus

Resolution: 0.14 nm - 0.31 nm

The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through ...

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electron microscope
electron microscope
JEM-1400Flash

Magnification: 10 unit - 1,500,000 unit
Resolution: 0.14, 0.2 nm

... magnification. To smoothly proceed to this series of observation, recent demands for easier observation steps to acquire higher-throughput image data are increasing. To meet those needs, a new 120 kV ...

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scanning electron microscope
scanning electron microscope
JSM-IT200

... area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW(TM) ...

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Jeol
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