Jeol scanning electron microscopes

Clear visibility promotes new discovery Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation ...

Easy to acquire data for all specimen types The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five ...

... operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, ...

... Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three ...

... areas with the scanning electron microscope to observe the fine structures at higher magnification & higher resolution.The observation targets found with the optical microscope ...

Magnification: 10 unit - 5,480,000 unit
Resolution: 0.7 nm - 3 nm

The JSM-IT800 incorporates our "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", ...