Malvern Panalytical measurement spectrometers

... dispersive X-ray fluorescence (EDXRF) benchtop spectrometer, provides elemental analysis with superior repeatability and accuracy, satisfying your customer’s consistency demands. Ease-to-use measurement ...

You’re invited to our special event focused on the Epsilon Xline – our on-line X-ray fluorescence innovation that’s set to revolutionize material usage, cost-efficiency, and product quality in roll-to-roll production. Our dynamic roundtable ...

... for fast, error-free sample loading and data entry Enhanced performance Simultaneous measurement of up to 28 elements, with a minimum of 2 second measurement per sample High sensitivity HiPer channels ...

Wavelength: 785 nm
Length: 520 mm
Width: 810 mm

... imaging delivered by the Morphologi 4 with chemical identification of individual particles by Raman spectroscopy in a single measurement. • Patented MDRS capability delivers representative component-specific particle ...

The Zetium XRF spectrometer leads the market in high-quality design and innovative features for elemental analysis from sub-ppm to percentage of Be to Am, meeting the most demanding process and quality control, as well ...

... throughout the tube’s lifetime, and together with high sensitivity, ZETA technology ensures that rapid analysis and short measurement times are upheld throughout the tube’s lifetime. ZETA technology robustly reduces the ...