{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
Weight: 17 kg
Length: 490 mm
Width: 251 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Weight: 8.7 kg
Length: 362 mm
Width: 251 mm
... optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic illumination are for inspection of semiconductors, industrial ...
Nikon Metrology
Weight: 8.6 kg
Length: 362 mm
Width: 251 mm
... optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic illumination are for inspection of semiconductors, industrial ...
Nikon Metrology
Weight: 9.5 kg
Length: 613 mm
Width: 251 mm
... techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended for ...
Nikon Metrology
Weight: 9.5 kg
Length: 657 mm
Width: 251 mm
... techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended for ...
Nikon Metrology
Magnification: 1 unit - 100 unit
Weight: 26 kg
Length: 295 mm
... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE MA200 Inverted microscope with episcopic illumination for inspection of industrial ...
Nikon Metrology
Weight: 10 kg
Length: 552 mm
Width: 229 mm
... flexible, compact, modular, inverted microscope for episcopic optical contrast techniques in conjunction with digital imaging camera accessories. It is ideal for metallurgical material inspection in many industrial ...
Nikon Metrology
Magnification: 5 unit - 100 unit
Weight: 14 kg
Length: 271 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Please specify:
Help us improve:
remaining