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Nikon Metrology inspection microscopes
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Weight: 17 kg
Length: 490 mm
Width: 251 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Magnification: 1 unit - 100 unit
Weight: 26 kg
Length: 295 mm
... is a flexible, modular, inverted microscope of innovative box design for episcopic optical contrast inspection techniques in conjunction with digital imaging accessories. It is ideal for metallurgical ...
Nikon Metrology
Weight: 9.5 kg
Length: 657 mm
Width: 251 mm
... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended ...
Nikon Metrology
Magnification: 5 unit - 100 unit
Weight: 14 kg
Length: 271 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Weight: 10 kg
Length: 552 mm
Width: 229 mm
... affordable, flexible, compact, modular, inverted microscope for episcopic optical contrast techniques in conjunction with digital imaging camera accessories. It is ideal for metallurgical material inspection ...
Nikon Metrology
Magnification: 50 unit
Weight: 45 kg
... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...
Nikon Metrology
Weight: 45 kg
... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...
Nikon Metrology
Weight: 8.7 kg
Length: 362 mm
Width: 251 mm
... modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic ...
Nikon Metrology
Weight: 8.6 kg
Length: 362 mm
Width: 251 mm
... modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic ...
Nikon Metrology
Weight: 9.5 kg
Length: 613 mm
Width: 251 mm
... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended ...
Nikon Metrology
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