Nikon Metrology inspection microscopes

1 company | 10 products
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polarizing microscope
polarizing microscope
ECLIPSE LV100N POL

Weight: 17 kg
Length: 490 mm
Width: 251 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

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Nikon Metrology
metallurgical microscope
metallurgical microscope
ECLIPSE MA200

Magnification: 1 unit - 100 unit
Weight: 26 kg
Length: 295 mm

... is a flexible, modular, inverted microscope of innovative box design for episcopic optical contrast inspection techniques in conjunction with digital imaging accessories. It is ideal for metallurgical ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse LV100ND

Weight: 9.5 kg
Length: 657 mm
Width: 251 mm

... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse Ci-POL

Magnification: 5 unit - 100 unit
Weight: 14 kg
Length: 271 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

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Nikon Metrology
metallographic microscope
metallographic microscope
Eclipse MA100N

Weight: 10 kg
Length: 552 mm
Width: 229 mm

... affordable, flexible, compact, modular, inverted microscope for episcopic optical contrast techniques in conjunction with digital imaging camera accessories. It is ideal for metallurgical material inspection ...

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Nikon Metrology
electron microscope
electron microscope
ECLIPSE L300N series

Magnification: 50 unit
Weight: 45 kg

... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse L200N series

Weight: 45 kg

... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...

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Nikon Metrology
digital microscope
digital microscope
Eclipse LV150NA

Weight: 8.7 kg
Length: 362 mm
Width: 251 mm

... modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse LV150N

Weight: 8.6 kg
Length: 362 mm
Width: 251 mm

... modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic ...

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Nikon Metrology
optical microscope
optical microscope
Eclipse LV100NDA

Weight: 9.5 kg
Length: 613 mm
Width: 251 mm

... contrast techniques together on one microscope stand thanks to a modular component programme. Nikon ECLIPSE LV100NDA and LV100ND These microscopes with episcopic and diascopic illumination are intended ...

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Nikon Metrology
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