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Weight: 17 kg
Length: 490 mm
Width: 251 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Magnification: 50 unit
Weight: 45 kg
... L200NA is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...
Nikon Metrology
Weight: 45 kg
... L200NA is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced ...
Nikon Metrology
Weight: 8.7 kg
Length: 362 mm
Width: 251 mm
... optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic illumination are for inspection of semiconductors, industrial ...
Nikon Metrology
Weight: 8.6 kg
Length: 362 mm
Width: 251 mm
... optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic illumination are for inspection of semiconductors, industrial ...
Nikon Metrology
Weight: 9.5 kg
Length: 613 mm
Width: 251 mm
... Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope ...
Nikon Metrology
Weight: 9.5 kg
Length: 657 mm
Width: 251 mm
... Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope ...
Nikon Metrology
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