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Weight: 17 kg
Length: 490 mm
Width: 251 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Magnification: 50 unit
Weight: 45 kg
... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced Semiconductor Microscopes ...
Nikon Metrology
Weight: 45 kg
... range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced Semiconductor Microscopes ...
Nikon Metrology
Weight: 8.7 kg
Length: 362 mm
Width: 251 mm
... Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. Thanks to the modular design, ...
Nikon Metrology
Weight: 8.6 kg
Length: 362 mm
Width: 251 mm
... Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. Thanks to the modular design, ...
Nikon Metrology
Weight: 9.5 kg
Length: 613 mm
Width: 251 mm
... applications. Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. ...
Nikon Metrology
Weight: 9.5 kg
Length: 657 mm
Width: 251 mm
... applications. Modular Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. ...
Nikon Metrology
Magnification: 5 unit - 100 unit
Weight: 14 kg
Length: 271 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
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